Transmission electron microscopes (TEM) are a powerful apparatus for structural ana- lysis. Although many research groups have their own electron microscopes recently, lots of researchers and PhD students are not able to operate the electron microscope and analyze the data efficiently and perfectly, which would be due to the complicated TEM operation and complicated analysis of the actual TEM data.
Although various excellent specialized books for TEM have been published, yet there are not many books for TEM beginners. This book is for the TEM beginners who would like to operate TEM, overview the TEM, take pictures, and analyze the TEM data. When we see the specialized book for TEM, there are many mathematical equations and complicated imaging principles in the book, which is a little high hurdle for a TEM beginner. In this book, the complicated mathematical equations were reduced as little as possible, and the book is focused on the actual views of TEM data and analysis.
This book would be helpful for beginners who would like to observe and ana- lyze the samples in front of them. Recently, several companies can supply TEM pho- tographs by their technique with a charge, and many researchers would make use of them. Sometimes, it is a good idea to ask the professional companies to prepare the TEM samples and to take TEM images with paying. If we ask the professional com- panies, the money, effort, and time can be saved, comparing with the money, effort, and time to purchase an electron microscope, to educate good TEM operators, and to obtain the TEM data. Such means can be suggested if the purpose and time are restric- ted and limited. However, it should be noted that the researchers should have clear eyes that can grasp the quality of the TEM data. It is important for them to see many examples of the actual TEM analysis, to analyze by themselves, and to distinguish the quality of the TEM data, in addition to learning the complicated principles of TEM. For them, necessary things would not be the complicated operation technique but under- standing the analysis method of the TEM data.
Of course, it is mandatory for researchers, who would like to obtain and analyze the TEM data perfectly, to understand the basic principles of TEM by reading many specialized good books. Reference books would be useful for the researchers who would like to understand and study the TEM in details. However, many students and researchers are under the pressure of necessity to understand their own TEM data and to extract necessary information for them as soon as possible instead of perfect under standing the TEM principles. It is much obliged for the author if this book is helpful for them.
The author would like to acknowledge K. Hiraga, D. Shindo, M. Hirabayashi, E. Aoyagi, S. Nakajima, A. Tokiwa, M. Kikuchi, Y. Syono, J.-O. Bovin, A. Carls- son, L. R. Wallenberg, J.-O. Malm, C. Svensson, M. Jansen, C. Linke, I. Higashi, T. Tanaka, Y. Ishizawa, O. Terasaki, X. D. Zou, S. Hovmöller, I. Narita, N. Koi, A. Nishi- waki, T. Hirano, K. Suganuma, T. Kajitani, H. Yamane, K. Takagi, T. Hirai, T. Mat- suda, M. Murakami, H. Kawata, H. Wakimoto, H. Ishikawa, E. Bruneel, S. Hoste, M. Nishijima, Y. Osawa, Y. Tamou, N. Kikuchi, R. V. Belosludov, Y. Kawazoe, Y. Tokura, K. Osamura, T. Kizu, K. Kosuge, N. Kobayashi, Y. Hirotsu, T. Kusunose, K. Niihara, H. Nakae, and S. Hosoya for excellent collaborative works, useful discussion, provid- ing samples and experimental help. It is a great pleasure to publish this book in the international year of crystallography.

Preface — v

Table for physical constants — ix

1 Introduction —1

1.1 Characteristic of electron microscopy-1

1.2 What information can be obtained by electron microscopy? — 2

1.3 Various types of electron microscopy— 5

2 Structure and principle of electron microscopes— 8

2.1 Structure of transmission electron microscope— 8

2.2 Observation mechanism of atoms by electrons-10

2.3 Information from electron diffraction pattern —13

2.4 High-resolution electron microscopy —15

2.5 Scanning electron microscope —17

2.6 Electron energy-loss spectroscopy —19

2.7 Energy dispersive X-ray spectroscopy — 22

2.8 High-angle annular dark-field scanning TEM — 23

2.9 Electron holography and Lorentz microscopy— 24

2.10 Image simulation — 26

3 Practice of HREM — 28

3.1 Sample preparation — 28

3.2 Specimen preparation methods — 28

3.3 Structure analysis by X-ray diffraction —31

3.4 TEM observation — 33

3.5 HREM observation — 38

3.6 Fourier filtering— 41

3.7 Resolution of HREM images — 42

3.8 Prevention of damage and contamination —43

3.9 Taking images and reading data — 44

3.10 Mental attitude for TEM — 45

4 Characterization by HREM — 46

4.1 What information can be obtained? — 46

4.2 Direct atomic observation —46

4.3 Crystallographic image processing-51

4.4 Comparison of HREM image with calculated images —53

4.5 Atomic coordinates from HREM image — 54

4.6 Combination of HREM and electron diffraction — 56

4.7 Quantitative HREM analysis with residual indices — 61

4.8 Detection of atomic disordering by difference image — 64

4.9 Combination of diffraction amplitudes and phases — 70

4.10 Structural optimization by molecular orbital calculation — 72

4.11 Three-dimensional high-resolution imaging— 74

4.12 Detection of doping atoms in C60 solid clusters — 77

5 Electron diffraction analysis of nanostructured materials — 87

5.1 Modulated superstructures of TI-based copper oxides-87

5.2 Modulate structures of lanthanoid-based copper oxides — 91

5.3 Oxygen ordering in YBa2Cu307-x —94

5.4 Structures of Bi-based copper oxides — 98

5.5 Twin structures in BN nanoparticles — 100

6 HREM analysis of nanostructured materials —110

6.1 Defect structures —110

6.2 Interfaces and surface structures —113

6.3 GaAs-based semiconductor devices —116

6.4 Zeolite materials —119

6.5 Solid clusters and doping atoms —120

6.6 Surface structure with light elements —122

6.7 Crystal structures of Pb-based copper oxides —124

6.8 Structures of Sm-based copper oxides —129

6.9 Y-based copper oxides with high Jc —131

6.10 BN nanotubes — 134

6.11 BN nanotubes with cup-stacked structures — 140

6.12 BN nanotubes encaging Fe nanowires —145

6.13 Nanoparticles with 5-fold symmetry — 149

A Appendix —158

A.1 7 crystal systems and 14 Bravais lattices in three dimensions —158

A.2 Miller indices and direction in the crystals —159

A.3 Distances dhkl and angles φ of lattice planes —160

Index—163

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